Items where Subject is "TK7874 Microelectronics. Integrated circuits"

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Article

Zhang, Yin, Xuehan, Bai, Yan, Junhua, Xiao, Yongqi, Zhang, Wanyi, Chatwin, Chris and Young, Rupert (2019) A full-reference image quality assessment for multiply distorted image based on visual mutual information. Journal of Imaging Science and Technology. ISSN 1062-3701

This list was generated on Tue Apr 7 11:40:10 2020 BST.