Winfried Hensinger 2-Accepted-17.04.20.pdf (2.33 MB)
Engineering of microfabricated ion traps and integration of advanced on-chip features
journal contribution
posted on 2023-06-07, 07:27 authored by Zak David Romaszko, Seokjun Hong, Martin SiegeleMartin Siegele, Reuben Puddy, Foni Raphaël Lebrun-Gallagher, Sebastian WeidtSebastian Weidt, Winfried HensingerWinfried HensingerAtomic ions trapped in electromagnetic potentials have long been used for fundamental studies in quantum physics. Over the past two decades, trapped ions have been successfully used to implement technologies such as quantum computing, quantum simulation, atomic clocks, mass spectrometers and quantum sensors. Advanced fabrication techniques, taken from other established or emerging disciplines, are used to create new, reliable ion-trap devices aimed at large-scale integration and compatibility with commercial fabrication. This Technical Review covers the fundamentals of ion trapping before discussing the design of ion traps for the aforementioned applications. We overview the current microfabrication techniques and the various considerations behind the choice of materials and processes. Finally, we discuss current efforts to include advanced, on-chip features in next-generation ion traps.
History
Publication status
- Published
File Version
- Accepted version
Journal
Nature Reviews PhysicsISSN
2522-5820Publisher
Nature ResearchExternal DOI
Volume
2Page range
285-299Department affiliated with
- Physics and Astronomy Publications
Full text available
- Yes
Peer reviewed?
- Yes
Legacy Posted Date
2020-07-08First Open Access (FOA) Date
2020-11-28First Compliant Deposit (FCD) Date
2020-07-07Usage metrics
Categories
No categories selectedKeywords
Licence
Exports
RefWorks
BibTeX
Ref. manager
Endnote
DataCite
NLM
DC