Amorim Graf, Aline, Ogilvie, Sean Paul, Wood, Hannah J, Brown, Christopher J, Tripathi, Manoj, King, Alice A K, Dalton, Alan B and Large, Matthew J (2020) Raman metrics for molybdenum disulfide and graphene enable statistical mapping of nanosheet populations. Chemistry of Materials. ISSN 0897-4756
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Abstract
The growing research interest and uptake of layered nanomaterials for real-world applications require efficient, reliable, high-quality characterisation methods. Liquid-exfoliated graphene has well-established Raman spectroscopic metrics for mean size and thickness. In association with the high-resolution mapping process described here, distributions of nanosheet properties can be reconstructed. Here, we develop new, robust metrics for length and layer number of MoS₂ nanosheets, developed using resonant Raman spectroscopy, applicable to both liquid- and mechanically-exfoliated MoS₂. The use of metricised Raman mapping analysis, here demonstrated for graphene and MoS₂, facilitates the standardisation of characterisation, allowing the correlation of size- and thickness-sensitive applications’ performance with materials properties.
Item Type: | Article |
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Keywords: | Raman spectroscopy, statistical analysis, molybdenum disulphide, graphene, metrics |
Schools and Departments: | School of Mathematical and Physical Sciences > Physics and Astronomy |
SWORD Depositor: | Mx Elements Account |
Depositing User: | Mx Elements Account |
Date Deposited: | 01 Jul 2020 09:44 |
Last Modified: | 30 Jun 2021 01:00 |
URI: | http://sro.sussex.ac.uk/id/eprint/92231 |
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