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AFM and Raman study of graphene deposited on silicon surfaces nanostructured by ion beam irradiation
journal contribution
posted on 2023-06-07, 07:08 authored by Rossana Dell’Anna, Erica Iacob, Manoj TripathiManoj Tripathi, Alan DaltonAlan Dalton, Roman Böttger, Giancarlo PepponiNanoscale structures were produced on silicon surfaces by low-energy O ion irradiation: periodic rippled or terraced patterns formed spontaneously, depending on the chosen combination of beam incidence angle and ion fluence. Atomic force microscopy image processing and analysis accurately described the obtained nano-topographies. Graphene monolayers grown by chemical vapour deposition were transferred onto the nanostructured silicon surfaces. The interfacial interaction between the textured surface and the deposited graphene governs the conformation of the thin carbon layer; the resulting different degree of regularity and conformality of the substrate-induced graphene corrugations was studied and it was related to the distinctive topographical features of the silicon nanostructures. Raman spectroscopy revealed specific features of the strain caused by the alternating suspension and contact with the underlying nanostructures and the consequent modulation of the silicon-graphene interaction.
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Publication status
- Published
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- Accepted version
Journal
Journal of MicroscopyISSN
0022-2720Publisher
WileyExternal DOI
Department affiliated with
- Physics and Astronomy Publications
Full text available
- Yes
Peer reviewed?
- Yes
Legacy Posted Date
2020-05-29First Open Access (FOA) Date
2021-06-01First Compliant Deposit (FCD) Date
2020-05-28Usage metrics
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