Lioliou, G, Gemmell, N R, Mazzillo, M, Sciuto, A and Barnett, A M (2019) 4H-SiC Schottky diodes with Ni2Si contacts for X-ray detection. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 940. pp. 328-336. ISSN 0168-9002
![]() |
PDF
- Accepted Version
Available under License Creative Commons Attribution-NonCommercial No Derivatives. Download (1MB) |
Abstract
4H-SiC Schottky photodiodes, with epitaxial layers, employing thin (20 nm) Ni2Si Schottky contacts, were investigated for high temperature photon counting X-ray spectroscopy. Important X-ray photodiode detector parameters were extracted from electrical characterization within the temperature range 160 °C to 0 °C. The devices were found to be fully depleted at an applied electric field of 20 kV/cm; a leakage current density of 33 nA cm 1 nA cm−2 at 160 °C, was measured for one of the devices. The detectors were subsequently connected to low-noise photon counting readout electronics and investigated for their spectral performance at temperatures up to 100 °C. With the charge-sensitive preamplifier operated at the same temperature as the detector the best energy resolution (Full Width at Half Maximum at 5.9 keV) obtained decreased from 2.20 keV 0.04 keV (120 e rms 2 e rms) at 100 C to 1.20 keV 0.03 keV (65 e rms 2 e rms) at 0 C. The dominant source of noise broadening the 55Fe X-ray photopeak was found to be the dielectric noise, except for the spectra accumulated at 100 °C and long shaping times (>), in those case the main source of photopeak broadening was the white parallel noise.
Item Type: | Article |
---|---|
Additional Information: | A.M.B. acknowledges funding from the Leverhulme Trust, United Kingdom, in the form of a 2016 Philip Leverhulme Prize. Data underlying this work are subject to commercially confidentiality. The Authors regret that they cannot grant public requests for further access to any data produced during the study. |
Keywords: | Silicon Carbide; 4H-SiC; Schottky diodes; X-ray spectroscopy |
Schools and Departments: | School of Engineering and Informatics > Engineering and Design |
Research Centres and Groups: | Space Research Group |
Depositing User: | Lucy Arnold |
Date Deposited: | 05 Jul 2019 09:09 |
Last Modified: | 19 Jun 2020 01:00 |
URI: | http://sro.sussex.ac.uk/id/eprint/84748 |
View download statistics for this item
📧 Request an updateProject Name | Sussex Project Number | Funder | Funder Ref |
---|---|---|---|
Photon counting X-ray and gamma-ray spectroscopy with Al0.52In0.48P detectors | G2140 | EPSRC-ENGINEERING & PHYSICAL SCIENCES RESEARCH COUNCIL | EP/P021271/1 |
Unset | Unset | Leverhulme Trust | Unset |