Tools
Daus, Alwin, Vogt, Christian, Münzenrieder, Niko, Petti, Luisa, Knobelspies, Stefan, Cantarella, Giuseppe, Luisier, Mathieu, Salvatore, Giovanni A and Tröster, Gerhard (2016) Positive charge trapping phenomenon in n-channel thin-film transistors with amorphous alumina gate insulators. Journal of Applied Physics, 120 (24). p. 244501. ISSN 0021-8979
![]() |
PDF
- Accepted Version
Available under License Creative Commons Attribution-Non-Commercial. Download (29MB) |
![]() |
PDF
- Published Version
Available under License All Rights Reserved. Download (4MB) |
Official URL: http://dx.doi.org/10.1063/1.4972475
Item Type: | Article |
---|---|
Schools and Departments: | School of Engineering and Informatics > Engineering and Design |
Research Centres and Groups: | Sensor Technology Research Centre |
Depositing User: | Niko Munzenrieder |
Date Deposited: | 03 Jan 2017 15:35 |
Last Modified: | 02 Jul 2019 16:02 |
URI: | http://sro.sussex.ac.uk/id/eprint/66002 |
View download statistics for this item
📧 Request an update