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Electronic noise in charge sensitive preamplifiers for X-ray spectroscopy and the benefits of a SiC input JFET

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posted on 2023-06-09, 00:08 authored by Grammatiki LioliouGrammatiki Lioliou, Anna BarnettAnna Barnett
A comprehensive summary and analysis of the electronic noise affecting the resolution of X-ray, ?-ray and particle counting spectroscopic systems which employ semiconductor detectors and charge sensitive preamplifiers is presented. The noise arising from the input transistor of the preamplifier and its contribution to the total noise is examined. A model for computing the noise arising from the front-end transistor is also presented and theoretical calculations comparing the noise contribution of transistors made of different materials are discussed, emphasizing the advantages of wide bandgap transistor technology.

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Publication status

  • Published

File Version

  • Published version

Journal

Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

ISSN

0168-9002

Publisher

Elsevier

Volume

801

Page range

63-72

Department affiliated with

  • Engineering and Design Publications

Full text available

  • Yes

Peer reviewed?

  • Yes

Legacy Posted Date

2016-01-27

First Open Access (FOA) Date

2016-01-27

First Compliant Deposit (FCD) Date

2016-01-27

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