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A multi-energy (2–60 keV) calibration of 200 µ m and 400 µm diameter spectroscopic GaAs X-ray photodiodes
journal contribution
posted on 2023-06-08, 16:19 authored by Anna BarnettAnna Barnett, J E Lees, D J BassfordThin (2 µm active layer) spectroscopic p+-i-n+ GaAs X-ray photodiodes of circular mesa geometry (200 µm and 400 µm diameter; one representative diode of each diameter) have been characterised for their energy response using high-purity X-ray fluorescence calibration samples excited by an X-ray tube, giving energies between 2.1 keV (Au Ma1) and 21.18 keV (Pd Ka1), and an 241Am radioisotope ?-ray source (26.3 keV, 59.5 keV). The photodiodes were operated uncooled at +33°C. The 200 µm diameter device's energy resolution (FWHM) was found to be constant (0.79 keV) and primarily limited by electronics noise at energies between 2.1 keV and 21.18 keV, but it broadened to 0.85 keV at 26.3 keV, and to 1 keV at 59.5 keV. The 400 µm diameter device's energy resolution (FWHM) was constant (1.1 keV) for photon energies between 4.95 keV and 9.89 keV, but increased to 1.15 keV at 16.62 keV, 1.25 keV at 21.18 keV, 1.3 keV at 26.3 keV and 1.66 keV at 59.5 keV. The broadening of energy resolution (FWHM) observed in both cases is greater than can be attributed solely to increasing Fano noise and is hypothesised to be at least in part due to energy dependent charge trapping. However, for both types of device, the peak charge output from the devices was found to be linearly (R2 = 0.9999) dependent on incident X-ray energy.© 2013 IOP Publishing Ltd and Sissa Medialab srl.
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Publication status
- Published
Journal
Journal of InstrumentationISSN
1748-0221Publisher
Institute of PhysicsExternal DOI
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8Page range
P09014-P09014Department affiliated with
- Engineering and Design Publications
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- No
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- Yes
Legacy Posted Date
2013-11-13Usage metrics
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