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A varied shaping time noise analysis of Al0.8Ga0.2As and GaAs soft X-ray photodiodes coupled to a low-noise charge sensitive preamplifier
journal contribution
posted on 2023-06-08, 16:19 authored by Anna BarnettAnna Barnett, J E Lees, D J Bassford, J S NgThe noise sources affecting Al0.8Ga0.2As and GaAs spectroscopic X-ray photon counting p+–i–n+ photodiodes connected to a custom low-noise charge sensitive preamplifier are quantified by analysing the system's response to pulses from a signal generator and varying the system's shaping amplifier's shaping time (from 0.5 µs to 10 µs). The system is investigated at three temperatures (-10 °C, +20 °C and +50 °C) in order to characterise the variation of the component noise sources and optimum shaping time with temperature for Al0.8Ga0.2As and GaAs diodes. The analysis shows that the system is primarily limited by dielectric noise, hypothesised to be mainly from the packaging surrounding the detector, for both types of diode and at each temperature.
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Publication status
- Published
Journal
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated EquipmentISSN
0168-9002Publisher
ElsevierExternal DOI
Volume
673Page range
10-15Department affiliated with
- Engineering and Design Publications
Full text available
- No
Peer reviewed?
- Yes
Legacy Posted Date
2013-11-18Usage metrics
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