Non-invasive Imaging of Signals in Digital Circuits

Gebrial, W, Prance, R J, Clark, T D, Harland, C J, Prance, H and Everitt, M (2002) Non-invasive Imaging of Signals in Digital Circuits. Review of Scientific Instruments, 73 (3). pp. 1293-1298. ISSN 0034-6748

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In this article we describe the construction and use of a noninvasive (noncontact) electric potential probe to measure time delays of signals propagating through digital circuits. As we show, by incorporating such probes into a scanning microscope system we have been able to create time delay images of these signals. We suggest that future developments of this technique may lead to real time, high resolution imaging of digital pulses across complex very large scale integrated circuits. © 2002 American Institute of Physics.

Item Type: Article
Schools and Departments: School of Engineering and Informatics > Engineering and Design
Depositing User: Robert Prance
Date Deposited: 06 Feb 2012 21:13
Last Modified: 24 Jun 2015 12:20
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