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Non-invasive Imaging of Signals in Digital Circuits
journal contribution
posted on 2023-06-08, 09:18 authored by W Gebrial, Robert Prance, T D Clark, C J Harland, H Prance, M EverittIn this article we describe the construction and use of a noninvasive (noncontact) electric potential probe to measure time delays of signals propagating through digital circuits. As we show, by incorporating such probes into a scanning microscope system we have been able to create time delay images of these signals. We suggest that future developments of this technique may lead to real time, high resolution imaging of digital pulses across complex very large scale integrated circuits. © 2002 American Institute of Physics.
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Publication status
- Published
Journal
Review of Scientific InstrumentsISSN
0034-6748External DOI
Issue
3Volume
73Page range
1293-1298Department affiliated with
- Engineering and Design Publications
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- No
Peer reviewed?
- Yes
Legacy Posted Date
2012-02-06Usage metrics
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