Garvie, Miguel and Thompson, Adrian (2003) Evolution of Combinational and Sequential On-Line Self-Diagnosing Hardware. In: NASA/DoD Conference on Evolvable Hardware, Chicago, USA.

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Abstract

The evolution of circuits with on-line built-in self-test is
attempted in simulation for a full adder, a two bit multiplier
and an edge triggered D-Latch. Results show that evolved
designs perform full diagnosis using less or equal number
of components than hand-designed equivalents.

Item Type:	Conference or Workshop Item (Paper)
Additional Information:	Originality: Extends our earlier introduction of evolutionary design for circuits with on-line built-in self-test to practical sequential circuits. Rigour: Full diagnosis achieved for an edge-triggered D-latch, competitive with hand-designed solutions, promise for larger circuits. Signification: Improves the practicality of our novel technique by tackling the considerable challenge presented by sequential circuits: implications throughout electronic self-test. Outlet/citations: This conference achieves good exposure to US space and military scientists. GoogleScholar=4
Schools and Departments:	School of Engineering and Informatics > Informatics
Depositing User:	Adrian Thompson
Date Deposited:	06 Feb 2012 20:31
Last Modified:	12 Apr 2012 10:40
URI:	http://sro.sussex.ac.uk/id/eprint/26401

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