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Wavelets for detecting mechanical faults with high sensitivity
A method of detecting transients in mechanical systems by matching wavelets with associated signal is proposed, leading to a development of joint time–frequency–scale distribution. The three variables, the time, frequency and scale, have maximised the chance for finding similar signal segments from a system under inspection. The sensitivity is shown to be very high due to closer matching and better choice of wavelet shapes, which is essential for early fault detection and failure prevention. Fundamental types of wavelets are introduced based on the shapes of widely encountered system responses. A method of processing the three-dimensional image is suggested for interpreting the time–frequency–scale wavelet map, where the properties of the object patterns uncover the features of a signal source, so as to understand the defect and to indicate the condition of a diagnosed system. The joint distribution is demonstrated to be useful in detecting transients from different mechanical systems. Implementation and examples are discussed.
History
Publication status
- Published
Journal
Mechanical Systems and Signal ProcessingISSN
0888-3270Publisher
ElsevierExternal DOI
Issue
4Volume
15Page range
685-696Pages
12.0Department affiliated with
- Engineering and Design Publications
Notes
To take advantage of time-frequency analysis and time-scale analysis, a new joint time-frequency and time-scale 3D representation is proposed. The approach is particularly useful to detect incipient faults from a mechanical signal. The sensitivity of detecting early fault is very high because both frequency and scale are set as variable to provide a high shape-matching opportunity. The methodology can be applicable to many incipient fault diagnosis. 2 PhD students used the idea in their research, Wang (w.j.wang@sussex.ac.uk) undertook 100% work, also adopted by other researchers, such as in the application of heart sounds. The paper has been quoted by investigators.Full text available
- No
Peer reviewed?
- Yes
Legacy Posted Date
2012-02-06Usage metrics
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