Scarle, S, Ewels, C P and Heggie, M I (2005) Simulation of the delamination of thin films. European Physical Journal B: Condensed Matter and Complex Systems, 46 (4). pp. 529-534. ISSN 1434-6028

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Abstract

We simulate thin film delamination using a lattice springs model. We use this model to construct a phase diagram of different delamination behaviours, produced by varying the compression of the film and also the radius to which local relaxation is allowed to take place about failing bonds. From this we see a progression from laminar and linear behaviours to radial and rounded features as compressive stress is increased. Sinusoidal telephone cord behaviour occurs only at a small range of fairly low stresses, and thin films.

Item Type:	Article
Additional Information:	ISI:000232040500012 Keywords: ATOMIC-FORCE MICROSCOPY; BUCKLING PATTERNS; SILICON; CARBON; DEPOSITION; STABILITY; BLISTERS; GROWTH; MODE
Schools and Departments:	School of Life Sciences > Chemistry
Depositing User:	Malcolm Heggie
Date Deposited:	06 Feb 2012 18:22
Last Modified:	15 Jun 2012 10:02
URI:	http://sro.sussex.ac.uk/id/eprint/15981

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