Reliability-guaranteed admission control for mobile computation offloading under Nakagami fading channel

Qu, Guixian, Zhou, Jianshan, Sheng, Zhengguo, Yu, Haiyang and Ren, Yilong (2021) Reliability-guaranteed admission control for mobile computation offloading under Nakagami fading channel. IEEE Wireless Communications Letters, 10 (10). pp. 2195-2199. ISSN 2162-2337

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Abstract

The coupled stochastic channel interferences can lead to intermittent connectivity and invalid fragment transmissions, which pose a significant challenge to guarantee the reliability of computation offloading. A wide variety of conventional approaches to making offloading decisions are based on the fundamental condition that channels are sufficiently reliable for completing each transmission session. However, the reliability that a user can successfully offload a computation task before a restricted deadline remains unexplored under the interference channels. In this letter, we focus on the Nakagami-m fading channel and propose an analytical framework to characterize the reliability of computation offloading with the restrictions of application deadline and offloading data size in the presence of coupled stochastic interferences. A lower-bound offloading reliability capturing coupled randomness is theoretically derived. Based on the analytical framework, we further propose an admission control method for users to make computation offloading decisions. Simulation results verify our theoretical framework and show the superior performance of the proposed method over other benchmark schemes in terms of guaranteeing reliability.

Item Type: Article
Additional Information: © 2021 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
Keywords: admission control, mobile computing, reliability
Schools and Departments: School of Engineering and Informatics > Engineering and Design
SWORD Depositor: Mx Elements Account
Depositing User: Mx Elements Account
Date Deposited: 12 Jul 2021 06:59
Last Modified: 11 Feb 2022 16:00
URI: http://sro.sussex.ac.uk/id/eprint/100276

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