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IEEE format 3D Mesh Phantom Paper V31 20 Apr 2016 final.pdf (642.33 kB)

A 3D multi-frequency response electrical mesh phantom for validation of the planar structure EIT system performance

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conference contribution
posted on 2023-06-09, 01:35 authored by A Zarafshani, Tabassum-Ur-Razaq Qureshi, T Bach, Chris ChatwinChris Chatwin, M Soleimani
Assessment and validation of the Electrical Impedance Tomography (EIT) system performance and calibration of systematic errors in the electrical field generated inside of the interrogated volume is an important requirement. System instabilities can be caused by the EIT design and must be characterized before and during the clinical trials. Evaluation of the Sussex EIT system used in the clinical study can be based on a realistic electronic phantom. We designed a mesh phantom based on the electrode configuration and mesh structures of the image reconstruction. The phantom has the capability of modelling the cellular electrical properties that are operative within a circular homogeneous medium. The design is optimized to assess the planar topology of the internal impedance distribution. The system employs the information from the electrical properties of biological tissues to evaluate the Cole-Cole dispersion data. This mesh phantom is capable of producing localized conductivity perturbations between each arbitrary channel in the electrode placement planar phantom topology by measuring all 1416 combinations that are to be used in the image reconstruction. The phantom is especially designed for the Sussex EIT system to validate system performance of measurements consisting of SNR, and modelling system accuracy.

History

Publication status

  • Published

File Version

  • Accepted version

Journal

Proceedings of the 2016 IEEE International Conference on Electro Information Technology (EIT); University of North Dakota; 19-21 May 2016

ISSN

2154-0373

Page range

1-5

ISBN

9781467399852

Department affiliated with

  • Engineering and Design Publications

Research groups affiliated with

  • Industrial Informatics and Signal Processing Research Group Publications

Full text available

  • Yes

Peer reviewed?

  • Yes

Legacy Posted Date

2016-06-08

First Open Access (FOA) Date

2016-06-08

First Compliant Deposit (FCD) Date

2016-06-08

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