Microscopic resolution broadband dielectric spectroscopy

Mukherjee, S, Watson, P and Prance, R J (2011) Microscopic resolution broadband dielectric spectroscopy. Journal of Physics: Conference Series, 310 (1). 012003. ISSN 1742-6588

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Abstract

Results are presented for a non-contact measurement system capable of micron level spatial resolution. It utilises the novel electric potential sensor (EPS) technology, invented at Sussex, to image the electric field above a simple composite dielectric material. EP sensors may be regarded as analogous to a magnetometer and require no adjustments or offsets during either setup or use. The sample consists of a standard glass/epoxy FR4 circuit board, with linear defects machined into the surface by a PCB milling machine. The sample is excited with an a.c. signal over a range of frequencies from 10 kHz to 10 MHz, from the reverse side, by placing it on a conducting sheet connected to the source. The single sensor is raster scanned over the surface at a constant working distance, consistent with the spatial resolution, in order to build up an image of the electric field, with respect to the reference potential. The results demonstrate that both the surface defects and the internal dielectric variations within the composite may be imaged in this way, with good contrast being observed between the glass mat and the epoxy resin.

Item Type: Article
Schools and Departments: School of Engineering and Informatics > Engineering and Design
Subjects: T Technology > TA Engineering (General). Civil engineering (General) > TA0165 Engineering instruments, meters, etc. Industrial instrumentation
T Technology > TA Engineering (General). Civil engineering (General) > TA0174 Engineering design
Depositing User: Shrijit Mukherjee
Date Deposited: 09 Dec 2014 11:18
Last Modified: 07 Mar 2017 07:02
URI: http://sro.sussex.ac.uk/id/eprint/45370

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