Multibeam multiphoton microscopy with adaptive optical correction

Coelho, Simao, Poland, Simon, Li, David Day-Uei, Krstajic, Nikola, Henderson, Robert and Ameer-Beg, Simon (2013) Multibeam multiphoton microscopy with adaptive optical correction. In: SPIE: Photonics West, 2-7 February 2013, The Moscone Center, San Francisco, California, USA.

Full text not available from this repository.
Item Type: Conference or Workshop Item (Paper)
Schools and Departments: School of Engineering and Informatics > Engineering and Design
Subjects: Q Science > QC Physics > QC0350 Optics. Light > QC0450 Spectroscopy
T Technology > TK Electrical engineering. Electronics Nuclear engineering > TK0452 Electric apparatus and materials. Electric circuits. Electric networks
Depositing User: David Day-Uei Li
Date Deposited: 15 May 2013 10:42
Last Modified: 09 Jun 2015 13:29
URI: http://sro.sussex.ac.uk/id/eprint/43144
📧 Request an update