Characterization of large-scale non-uniformities in a 20k TDC/SPAD array integrated in a 130nm CMOS process

Veerappan, C, Richardson, J, Walker, R, Li, D U, Fishburn, M W, Stoppa, D, Borghetti, F, Maruyama, Y, Gersbach, M, Henderson, R K, Bruschini, C and Charbon, E (2011) Characterization of large-scale non-uniformities in a 20k TDC/SPAD array integrated in a 130nm CMOS process. In: IEEE 41th European Solid-State Device Research Conference (ESSDERC), Helsinki, Finland.

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Item Type: Conference or Workshop Item (Paper)
Additional Information: Main author, the first five authors contribute equally.
Schools and Departments: School of Engineering and Informatics > Engineering and Design
Depositing User: David Day-Uei Li
Date Deposited: 06 Feb 2012 20:31
Last Modified: 04 Apr 2012 09:52
URI: http://sro.sussex.ac.uk/id/eprint/26404
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