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Characterization of large-scale non-uniformities in a 20k TDC/SPAD array integrated in a 130nm CMOS process

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posted on 2023-06-08, 06:37 authored by C Veerappan, J Richardson, R Walker, D U Li, M W Fishburn, D Stoppa, F Borghetti, Y Maruyama, M Gersbach, R K Henderson, C Bruschini, E Charbon
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History

Publication status

  • Published

Publisher

IEEE Solid-State Circuits Society

Presentation Type

  • paper

Event name

IEEE 41th European Solid-State Device Research Conference (ESSDERC)

Event location

Helsinki, Finland

Event type

conference

Department affiliated with

  • Engineering and Design Publications

Notes

Main author, the first five authors contribute equally.

Full text available

  • No

Peer reviewed?

  • Yes

Legacy Posted Date

2012-02-06

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