Reflectance of the dielectric layers containing metal nanoparticles formed by ion implantation

Stepanov, A L, Hole, D E and Townsend, P D (1999) Reflectance of the dielectric layers containing metal nanoparticles formed by ion implantation. Journal of Non-Crystalline Solids, 244 (2-3). pp. 275-279. ISSN 0022-3093

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Abstract

Composites with silver nanoparticles have been prepared by ion implantation in soda–lime glass at 60 keV to a dose of 7.0 × 1016 ion/cm2 at a current density of 10 μA/cm2. The silver profile distribution was determined by Rutherford backscattering spectroscopy. Optical properties of composites were characterized by reflectance measured from both the implanted and the rear face of the sample. For modelling of reflectivity spectra a multilayer structure was considered and a matrix method using complex Fresnel coefficients was applied. Dielectric permeabilities of composite layers were calculated using the Maxwell–Garnet effective medium theory. Quality agreement between theoretical and experimental reflectivity spectra was achieved by accounting for the non-uniform silver concentration distribution with depth in the implanted glass surface.

Item Type: Article
Schools and Departments: School of Engineering and Informatics > Engineering and Design
Depositing User: Dave Hole
Date Deposited: 06 Feb 2012 19:03
Last Modified: 17 Sep 2012 14:15
URI: http://sro.sussex.ac.uk/id/eprint/19197
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